As it was mentionned in the ICSM "cahier des charges", the light, neutron and x-ray scattering techniques are useful for studying new materials for nuclear and decontamination, to understand ion separation and reprocessing as well as catalysis and analyse supramolecular architectures in solution or as solids. They should permit a fine analysis at various scales from nano up to microns.
x-ray diffraction (8 keV), small angle x-ray scattering (hard x-ray 17 keV), reflectivity, grazing incidence, static and dynamic light scattering, non linear optics (SHG)
