List of equipments: X-Ray Diffractometer



This device is devoted to X-ray diffraction in reflection mode, transmission mode, grazing incidence and X-ray reflectometry.

This diffractometer is equipped with a Cu Kα X-ray source (λ=1.5418 Å). It is equipped with two circle goniometers with independent stepper motors and optical encoders allowing for a high reproducibility in the sample displacement. The optical components can be easily removed and the instrument configuration can be easily turned from one to another (grazing incidence, X-ray reflectometry). This diffractometer is a very accurate and tunable device which allows for working in very different application domains such as powder X-ray diffraction, in situ high temperature experiments, transmission …

It allows for performing structural analyses such as:

  • Phase identification,
  • Lattice parameter refinement,
  • Rietveld structure refinement,
  • Determination of crystallite size,
  • Qualitative and semi-quantitative phase analysis,
  • In situ structural modifications as a function of temperature,
  • Thin film analyses.

For further information, please contact B. Corso (+33 (0)4 66 79 17 64)



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